Stock Status:
In Stock
Delivery Status:
8 weeks
Description
APD 2000 PRO diffractometer is an high power - Theta/2Theta - laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials.
Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humiduty chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.
- High Speed Rate (1000°/min)
- High Precision Angle Reproducibility (+/- 0.0001°)
- Fast Measurement and Highly Reliable Data
- Extremely precise angular values thanks to stepper motors with optical encoders
- Easy to handle
Features
- Qualiltative and Quantitative Powder X-Ray Diffractometer
- High Stability X-Ray generator through precision feedback control circuits
- Automatic ramp of the high voltage and emission current to preset values
- Ceramic X-Ray tubes with high reproducibility and stability of focus position
- Microfocus tubes and policapillary collimators
- Possibility of changing automatically from transmission to reflection mode
- High precision, high speed goniometer controlled by optical encoders
- Traditional, rotating, multi sample and capillary sample holders
- Scintillation counters, silicon strip and energy dispersive detectors
- Non-ambient analysis, low and high temperature chambers, humidity device
Application
- Qualitative and quantitative phase analysis
- non-ambient analysis
- retained austenite quantification
- structure solution and refinement
- crystallite size and crystallinity calculations
- Geology and Mineralogy / Clays
- Glass / Ceramics / Cement
- Chemicals / Petrochemicals
- Catalyst / Polymers
- Forensics
- Agricultural Sciences
- Biosciences / Environmental
- Pharmaceuticals
- Cosmetics
- Art and Archeology
X Ray Generator | |
---|---|
[Maximum Output Power]: | 3 kW (option |
[Output Stability]: | < 0.01 % (for 10% power supply fluctuation) |
[Max Output Voltage]: | 60 kV |
[Max Output Current]: | 60 mA (option |
[Voltage Step Width]: | 0.1 kV |
[Current Step Width]: | 0.1 mA |
[Ripple]: | 0.03% rms < 1kHz, 0.75% rms > 1kHz |
[Preheat and Ramp]: | Automatic preheat and ramp control circuit |
[Input Voltage]: | 220 Vac +/-10%, 50 or 60 Hz, single phase |
[Size]: | Width 48.3 cm, height 13.3 cm, depth 56 cm |
X-Ray Tube | |
[Type]: | Glass (option |
[Focus]: | 0.4 x 12 mm LFF (other options available) |
[Max Output]: | 3.0 kW |
Goniometer | |
[Configurations]: | Vertical and Horizontal Theta/2Theta geometry |
[Measuring circle diameters]: | 350 - 400 mm |
[Vertical Scanning Angular Range]: | - 60° < 2 Theta < + 168° (according to accessories) |
[Horizontal Scanning Angular Range]: | - 110° < 2 Theta < + 168° (according to accessories) |
[Smallest selectable stepsize]: | 0.0001° |
[Angular reproducibility]: | +/- 0.0001° |
[Modes of operation]: | Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation |
[Variable Divergence slits]: | 0 - 4° |
[Variable Anti-Divergence slits]: | 0 - 4° |
[Variable Receiver slits]: | 0 - 4° |
[Soller slits]: | 2° |
Detector | |
[Type]: | Scintillation counter Nal (options |
[Countrate]: | 2 x 10(6) cps (Nal); 2 x 10(7) cps (Yap(Ce)) |
Case | |
[Dimensions]: | Width 850 mm, heigh 1680 mm, depth 750 mm |
[Leakage X-rays]: | < 1 mSv/Year (full safety shielding according to the international guidelines) |
Processing Unit | |
[Basic Data Processing]: | Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation |