APD 2000 PRO High Energy XRD

APD 2000 PRO High Speed High Energy X-ray Diffractometer XRD

Stock Status: In Stock
Delivery Status: 8 weeks


APD 2000 PRO diffractometer is an high power - Theta/2Theta - laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials.

Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humiduty chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.

  • High Speed Rate (1000°/min)  
  • High Precision Angle Reproducibility (+/- 0.0001°)  
  • Fast Measurement and Highly Reliable Data  
  • Extremely precise angular values thanks to stepper motors with optical encoders  
  • Easy to handle  


  • Qualiltative and Quantitative Powder X-Ray Diffractometer 
  • High Stability X-Ray generator through precision feedback control circuits  
  • Automatic ramp of the high voltage and emission current to preset values  
  • Ceramic X-Ray tubes with high reproducibility and stability of focus position 
  • Microfocus tubes and policapillary collimators 
  • Possibility of changing automatically from transmission to reflection mode  
  • High precision, high speed goniometer controlled by optical encoders  
  • Traditional, rotating, multi sample and capillary sample holders  
  • Scintillation counters, silicon strip and energy dispersive detectors  
  • Non-ambient analysis, low and high temperature chambers, humidity device 


  • Qualitative and quantitative phase analysis 
  • non-ambient analysis 
  • retained austenite quantification 
  • structure solution and refinement 
  • crystallite size and crystallinity calculations 
  • Geology and Mineralogy / Clays 
  • Glass / Ceramics / Cement  
  • Chemicals / Petrochemicals  
  • Catalyst / Polymers 
  • Forensics 
  • Agricultural Sciences  
  • Biosciences / Environmental 
  • Pharmaceuticals  
  • Cosmetics  
  • Art and Archeology 

X Ray Generator
[Maximum Output Power]: 3 kW (option
[Output Stability]: < 0.01 % (for 10% power supply fluctuation)
[Max Output Voltage]: 60 kV
[Max Output Current]: 60 mA (option
[Voltage Step Width]: 0.1 kV
[Current Step Width]: 0.1 mA
[Ripple]: 0.03% rms < 1kHz, 0.75% rms > 1kHz
[Preheat and Ramp]: Automatic preheat and ramp control circuit
[Input Voltage]: 220 Vac +/-10%, 50 or 60 Hz, single phase
[Size]: Width 48.3 cm, height 13.3 cm, depth 56 cm
X-Ray Tube
[Type]: Glass (option
[Focus]: 0.4 x 12 mm LFF (other options available)
[Max Output]: 3.0 kW
[Configurations]: Vertical and Horizontal Theta/2Theta geometry
[Measuring circle diameters]: 350 - 400 mm
[Vertical Scanning Angular Range]: - 60° < 2 Theta < + 168° (according to accessories)
[Horizontal Scanning Angular Range]: - 110° < 2 Theta < + 168° (according to accessories)
[Smallest selectable stepsize]: 0.0001°
[Angular reproducibility]: +/- 0.0001°
[Modes of operation]: Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation
[Variable Divergence slits]: 0 - 4°
[Variable Anti-Divergence slits]: 0 - 4°
[Variable Receiver slits]: 0 - 4°
[Soller slits]:
[Type]: Scintillation counter Nal (options
[Countrate]: 2 x 10(6) cps (Nal); 2 x 10(7) cps (Yap(Ce))
[Dimensions]: Width 850 mm, heigh 1680 mm, depth 750 mm
[Leakage X-rays]: < 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit
[Basic Data Processing]: Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation
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